Advanced Materials Characterization : Basic Principles, Novel Applications, and Future Directions
Book Details
Format
Paperback / Softback
Book Series
Advanced Materials Processing and Manufacturing
ISBN-10
1032375116
ISBN-13
9781032375113
Publisher
Taylor & Francis Ltd
Imprint
CRC Press
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Nov 29th, 2024
Print length
130 Pages
Weight
238 grams
Dimensions
15.60 x 23.40 x 1.10 cms
Ksh 9,200.00
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The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth.
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