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Advanced Tomographic Methods in Materials Research and Engineering

By: Berlin) Banhart Hahn-Meitner-Institute John (Department of Materials Science (Author)

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Ksh 46,400.00

Format: Hardback or Cased Book

ISBN-13: 9780199213245

Publisher: Oxford University Press

Publication Date: Mar 20th, 2008

Weight: 955 grams

Dimension: 24.00 x 16.20 x 2.50 cms

Category: Tomography

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Tomography provides three-dimensional images of materials or engineering components and an unprecedented insight into their internal structure. This book, written for applied physicists, materials scientists and engineers, discusses recent developments in the field, such as the extension of tomographic methods to materials research and engineering.

Get Advanced Tomographic Methods in Materials Research and Engineering by John (Department of Materials Science, Hahn-Meitner-Institute, Berlin) Banhart at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Oxford University Press and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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