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Advanced VLSI Design and Testability Issues

By: India) Tripathi Suman Lata (LPU,Punjab (Author) , Sobhit Saxena (Author) , India.) Mohapatra Sushanta Kumar (Kalinga Institute of Industrial Technology (Author)

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Ksh 22,800.00

Format: Hardback or Cased Book

ISBN-13: 9780367492823

Publisher: Taylor & Francis Ltd

Publication Date: Aug 19th, 2020

Weight: 718 grams

Dimension: 16.20 x 24.10 x 2.70 cms

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This book provides in-depth knowledge of VLSI and also the broad aspects of it by explaining its applications in different fields e.g. image processing and biomedical. The role of fault simulation algorithms is very well explained and its implementation using Verilog is the key aspect of this book.

Get Advanced VLSI Design and Testability Issues by Suman Lata (LPU,Punjab, India) Tripathi at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Taylor & Francis Ltd and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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