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Advances in Imaging and Electron Physics
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Advances in Imaging and Electron Physics

Book Details

Format Hardback or Cased Book
ISBN-10 0443193266
ISBN-13 9780443193262
Publisher Elsevier Science Publishing Co Inc
Imprint Academic Press Inc
Country of Manufacture NL
Country of Publication GB
Publication Date Mar 27th, 2023
Print length 284 Pages
Weight 568 grams
Dimensions 15.80 x 23.90 x 2.30 cms
Ksh 32,250.00
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Advances in Imaging and Electron Physics, Volume 226 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this release cover Characterization of nanomaterials properties using FE-TEM, Cold field-emission electron sources: From higher brightness to ultrafast beams, Every electron counts: Towards the development of aberration optimized and aberration corrected electron sources, and more. The series features articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy and the computing methods used in all these domains.

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