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Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation

By: M.E. Fitzpatrick (Author) , Alain Lodini (Author)

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Ksh 50,400.00

Format: Hardback or Cased Book

ISBN-13: 9780415303972

Publisher: Taylor & Francis Ltd

Publication Date: Feb 6th, 2003

Dimension: 22.90 x 15.20 x 88.50 cms

Category: Stress & fracture

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Neutron and synchrotron X-ray diffraction have emerged as leading techniques for stress analysis. This book presents an overview of the principles of these techniques and examples of their applications to a range of materials and engineering problems. It contains 20 papers from leading international experts in residual stress analysis covering the

Get Analysis of Residual Stress by Diffraction using Neutron and Synchrotron Radiation by M.E. Fitzpatrick at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Taylor & Francis Ltd and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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