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Atom Probe Field Ion Microscopy

By: Oak Ridge National Laboratory) Miller Metals and Ceramics Division M. K. (Metals and Ceramics Division (Author) , University of Oxford) Cerezo Department of Materials A. (Department of Materials (Author) , M. G. Hetherington (Author)

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Ksh 52,550.00

Format: Hardback or Cased Book

ISBN-13: 9780198513872

Publisher: Oxford University Press

Publication Date: Sep 19th, 1996

Weight: 1042 grams

Dimension: 24.20 x 16.40 x 3.30 cms

Category: Microscopy

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A definitive account of the theory, practice, and applications of atom probe field ion microscopy (APFIM). The APFIM technique provides a unique method for observing and chemically identifying single atoms on solid surfaces. New applications for this technique are rapidly emerging and graduate level material and surface scientists will enjoy this account of the state-of-the-art.

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