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Atom-Probe Field Ion Microscopy

By: Tien T. (Pennsylvania State University) Tsong (Author)

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Ksh 11,300.00

Format: Paperback or Softback

ISBN-13: 9780521019934

Publisher: Cambridge University Press

Publication Date: Sep 15th, 2005

Weight: 556 grams

Dimension: 23.40 x 15.70 x 2.20 cms

Category: Microscopy

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Atom-probe field ion microscopy is the only technique capable of imaging solid surfaces with atomic resolution, while chemically analysing surface atoms selected by the observer from the field ion image. This book presents the basic principles and illustrates the capabilities of the technique in the study of solid surfaces and interfaces at atomic resolution.

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