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Characterization of High Tc Materials and Devices by Electron Microscopy

By: Chicago) Browning Nigel D. (University of Illinois (Author) , Tennessee) Pennycook Stephen J. (Oak Ridge National Laboratory (Author)

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Ksh 8,400.00

Format: Paperback or Softback

ISBN-13: 9780521031707

Publisher: Cambridge University Press

Publication Date: Nov 23rd, 2006

Weight: 669 grams

Dimension: 24.30 x 16.80 x 2.10 cms

Category: Condensed matter physics

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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

Get Characterization of High Tc Materials and Devices by Electron Microscopy by Nigel D. (University of Illinois, Chicago) Browning at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Cambridge University Press and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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