Characterization of High Tc Materials and Devices by Electron Microscopy
Book Details
Format
Paperback / Softback
ISBN-10
0521031702
ISBN-13
9780521031707
Publisher
Cambridge University Press
Imprint
Cambridge University Press
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Nov 23rd, 2006
Print length
408 Pages
Weight
669 grams
Dimensions
24.30 x 16.80 x 2.10 cms
Product Classification:
Condensed matter physics (liquid state & solid state physics)Materials science
Ksh 8,600.00
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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.
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