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Characterization of High Tc Materials and Devices by Electron Microscopy
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Characterization of High Tc Materials and Devices by Electron Microscopy

Book Details

Format Hardback or Cased Book
ISBN-10 052155490X
ISBN-13 9780521554909
Publisher Cambridge University Press
Imprint Cambridge University Press
Country of Manufacture GB
Country of Publication GB
Publication Date Jul 6th, 2000
Print length 406 Pages
Weight 1,125 grams
Dimensions 24.40 x 17.00 x 2.40 cms
Ksh 25,550.00
Manufactured on Demand 0 in stock

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This is a clear account of the application of electron-based microscopies to the study of high-Tc superconductors. Written by leading experts, it provides a comprehensive review of scanning electron microscopy, transmission electron microscopy and scanning transmission electron microscopy, together with details of each technique and its applications.

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