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Cluster Secondary Ion Mass Spectrometry
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Cluster Secondary Ion Mass Spectrometry : Principles and Applications

Book Details

Format Hardback or Cased Book
ISBN-10 0470886056
ISBN-13 9780470886052
Publisher John Wiley & Sons Inc
Imprint John Wiley & Sons Inc
Country of Manufacture SG
Country of Publication GB
Publication Date Jun 28th, 2013
Print length 368 Pages
Weight 762 grams
Dimensions 16.50 x 24.30 x 2.10 cms
Ksh 19,250.00
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This book describes the importance of the emerging technique Cluster Secondary Ion Mass Spectrometry (SIMS), which is used for the analysis of a range of solid materials, including everything from organic and polymeric materials, to cells and semiconductors.

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