CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications

Name: CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications
Brand: Materials Research Society
SKU: 9781605111285
Price: 17800 KES
Availability: OutOfStock
ISBN: 9781605111285

Book Details

Format Hardback

Book Series MRS Proceedings

ISBN-10 1605111287

ISBN-13 9781605111285

Publisher Materials Research Society

Imprint Materials Research Society

Country of Manufacture GB

Country of Publication GB

Publication Date Nov 19th, 2009

Print length 194 Pages

Weight 432 grams

Dimensions 16.00 x 23.60 x 1.80 cms

Product Classification: Materials science

KSh 17,800.00

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.

Get CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications by Alexander A. Demkov at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Materials Research Society and it has 194 pages.