Conductive Atomic Force Microscopy : Applications in Nanomaterials
Book Details
Format
Hardback or Cased Book
ISBN-10
3527340912
ISBN-13
9783527340910
Publisher
Wiley-VCH Verlag GmbH
Imprint
Blackwell Verlag GmbH
Country of Manufacture
SG
Country of Publication
GB
Publication Date
Oct 11th, 2017
Print length
384 Pages
Weight
978 grams
Dimensions
17.60 x 25.10 x 2.50 cms
Product Classification:
NanotechnologyElectronic devices & materialsApplied optics
Ksh 24,850.00
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The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
Get Conductive Atomic Force Microscopy by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Wiley-VCH Verlag GmbH and it has pages.
