Defect-Induced Magnetism in Oxide Semiconductors
Book Details
Format
Paperback / Softback
ISBN-10
0323909078
ISBN-13
9780323909075
Publisher
Elsevier Science Publishing Co Inc
Imprint
Woodhead Publishing
Country of Manufacture
GB
Country of Publication
GB
Publication Date
May 24th, 2023
Print length
736 Pages
Weight
1,162 grams
Dimensions
15.00 x 23.10 x 3.60 cms
Product Classification:
Electricity, electromagnetism & magnetismMaterials scienceElectronics engineering
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Defect-Induced Magnetism in Oxide Semiconductors provides an overview of the latest advances in defect engineering to create new magnetic materials and enable new technological applications. First, the book introduces the mechanisms, behavior, and theory of magnetism in oxide semiconductors and reviews the methods of inducing magnetism in these materials. Then, strategies such as pulsed laser deposition and RF sputtering to grow oxide nanostructured materials with induced magnetism are discussed. This is followed by a review of the most relevant postdeposition methods to induce magnetism in oxide semiconductors including annealing, ion irradiation, and ion implantation. Examples of defect-induced magnetism in oxide semiconductors are provided along with selected applications. This book is a suitable reference for academic researchers and practitioners and for people engaged in research and development in the disciplines of materials science and engineering.
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