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Digital Holography for MEMS and Microsystem Metrology

By: Singapore) Asundi Anand (Nanyang Technological University (Author)

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Ksh 24,500.00

Format: Hardback or Cased Book

ISBN-13: 9780470978696

Publisher: John Wiley & Sons Inc

Publication Date: Jul 28th, 2011

Weight: 486 grams

Dimension: 23.70 x 16.40 x 1.90 cms

Category: ELECTRONICS & COMMUNICATIONS ENGINEERING

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By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.

Get Digital Holography for MEMS and Microsystem Metrology by Anand (Nanyang Technological University, Singapore) Asundi at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by John Wiley & Sons Inc and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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