Digital Holography for MEMS and Microsystem Metrology
by
Anand Asundi
Book Details
Format
Hardback or Cased Book
Book Series
The Wiley Microsystem and Nanotechnology Series
ISBN-10
0470978694
ISBN-13
9780470978696
Publisher
John Wiley & Sons Inc
Imprint
John Wiley & Sons Inc
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Jul 28th, 2011
Print length
228 Pages
Weight
486 grams
Dimensions
23.70 x 16.40 x 1.90 cms
Product Classification:
Electronics & communications engineering
Ksh 19,050.00
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By taking a practical approach to the industrial inspection of digital holography, Digital Holography for MEMS and Microsystem Metrology offers a description of the use of digital holography and its growing applications for MEMS characterization, residual stress measurement, design and evaluation and device testing and inspection.
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