Book Details
Format
Hardback or Cased Book
Book Series
Lecture Notes in Electrical Engineering
ISBN-10
0387717536
ISBN-13
9780387717531
Edition
2007 ed.
Publisher
Springer-Verlag New York Inc.
Imprint
Springer-Verlag New York Inc.
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Jul 25th, 2007
Print length
224 Pages
Product Classification:
Applied mathematicsElectrical engineering
Ksh 16,200.00
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Digital Noise Monitoring of Defect Origin is for both academics and professionals in the fields of engineering, biological sciences, physical science, and automation with particular emphasis on power engineering, oil-and-gas extraction, and aviation among others.
This book explores the initial stage of the origin of the defect taking into account technical, biological, and other features of several technologies. These technologies allow the defect monitoring at the beginning of the defect origin to be performed at the expense of extracting information from the noise. This book appeals to a wide audience focused on solving numerous problems.
Get Digital Noise Monitoring of Defect Origin by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Springer-Verlag New York Inc. and it has pages.
