Book Details
Format
Hardback or Cased Book
Book Series
Press Monographs
ISBN-10
0819441104
ISBN-13
9780819441102
Edition
illustrated Edition
Publisher
SPIE Press
Imprint
SPIE Press
Country of Manufacture
US
Country of Publication
GB
Publication Date
Jan 31st, 2003
Print length
475 Pages
Weight
880 grams
Dimensions
26.90 x 18.60 x 2.40 cms
Product Classification:
Materials scienceApplied optics
Ksh 12,400.00
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Developed in the 1990s, shearography - also called speckle pattern shearing interferometry - is an optical measuring and testing method. This work describes the development of second-generation digital shearography, which is effective in nondestructive testing.
The ever-increasing requirements of product quality and reliability demand more efficient measuring and testing methods that must be online, non-destructive, whole field, and without contact. Developed in the 1990s, shearography - also called speckle pattern shearing interferometry (SPSI) - is a coherent-optical measuring and testing method, similar to holographic interferometry. Unlike holography, however, shearography measures the gradient of the deformation rather than the deformation itself. Consequently, shearography can measure the strain information directly, increasing its importance as an industrial measuring tool. This work describes the development of second-generation digital shearography, which is effective in non-destructive testing (NDT), strain measurement, and vibration analysis due to its relative insensitivity to environmental disturbances.
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