Elements of Electromigration : Electromigration in 3D IC technology
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In this invaluable resource for graduate students and practicing professionals, Tu and Liu provide a comprehensive account of electromigration and give a practical guide on how to manage its effects in microelectronic devices, especially newer devices that make use of 3D architectures.
Get Elements of Electromigration by King-Ning Tu, Yingxia Liu at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Taylor & Francis Ltd and it has 132 pages.
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