Energy-Level Control at Hybrid Inorganic/Organic Semiconductor Interfaces
Softcover reprint of the original 1st ed. 2017
Book Details
Format
Paperback / Softback
Book Series
Springer Theses
ISBN-10
3319835505
ISBN-13
9783319835501
Edition
Softcover reprint of the original 1st ed. 2017
Publisher
Springer International Publishing AG
Imprint
Springer International Publishing AG
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Apr 29th, 2018
Print length
211 Pages
Product Classification:
Condensed matter physics (liquid state & solid state physics)Condensed matter physics (liquid state and solid state physics)Spectrum analysis, spectrochemistry, mass spectrometryMechanical engineeringElectronic devices & materialsElectronic devices and materialsOther technologies & applied sciencesOther technologies and applied sciences
Ksh 16,200.00
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This work investigates the energy-level alignment of hybrid inorganic/organic systems (HIOS) comprising ZnO as the major inorganic semiconductor.
This work investigates the energy-level alignment of hybrid inorganic/organic systems (HIOS) comprising ZnO as the major inorganic semiconductor. In addition to offering essential insights, the thesis demonstrates HIOS energy-level alignment tuning within an unprecedented energy range. (Sub)monolayers of organic molecular donors and acceptors are introduced as an interlayer to modify HIOS interface-energy levels. By studying numerous HIOS with varying properties, the author derives generally valid systematic insights into the fundamental processes at work. In addition to molecular pinning levels, he identifies adsorption-induced band bending and gap-state density of states as playing a crucial role in the interlayer-modified energy-level alignment, thus laying the foundation for rationally controlling HIOS interface electronic properties. The thesis also presents quantitative descriptions of many aspects of the processes, opening the door for innovative HIOS interfaces and for future applications of ZnO in electronic devices.
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