Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications
Book Details
Format
Hardback
ISBN-10
3527411526
ISBN-13
9783527411528
Publisher
Wiley-VCH Verlag GmbH
Imprint
Blackwell Verlag GmbH
Country of Manufacture
SG
Country of Publication
GB
Publication Date
Jul 2nd, 2014
Print length
344 Pages
Weight
898 grams
Dimensions
25.00 x 17.50 x 2.20 cms
Product Classification:
Optical physics
KSh 21,400.00
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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.
Get Fringe Pattern Analysis for Optical Metrology by J. Antonio Quiroga, Manuel Servin at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Wiley-VCH Verlag GmbH and it has 344 pages.
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