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Fringe Pattern Analysis for Optical Metrology
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Fringe Pattern Analysis for Optical Metrology : Theory, Algorithms, and Applications

Book Details

Format Hardback or Cased Book
ISBN-10 3527411526
ISBN-13 9783527411528
Publisher Wiley-VCH Verlag GmbH
Imprint Blackwell Verlag GmbH
Country of Manufacture SG
Country of Publication GB
Publication Date Jul 2nd, 2014
Print length 344 Pages
Weight 898 grams
Dimensions 25.00 x 17.50 x 2.20 cms
Product Classification: Optical physics
Ksh 21,400.00
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The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology.

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