Fundamentals of Electromigration-Aware Integrated Circuit Design
Softcover Reprint of the Original 1st 2018 ed.
Book Details
Format
Paperback / Softback
ISBN-10
3030088111
ISBN-13
9783030088118
Edition
Softcover Reprint of the Original 1st 2018 ed.
Publisher
Springer Nature Switzerland AG
Imprint
Springer Nature Switzerland AG
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Dec 14th, 2018
Print length
159 Pages
Ksh 13,500.00
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The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration.
The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration’s negative impact on circuit reliability.
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