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Handbook of Optical Metrology
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Handbook of Optical Metrology : Principles and Applications, Second Edition

Book Details

Format Hardback or Cased Book
ISBN-10 1466573597
ISBN-13 9781466573598
Publisher Taylor & Francis Inc
Imprint CRC Press Inc
Country of Manufacture US
Country of Publication GB
Publication Date Apr 9th, 2015
Print length 920 Pages
Weight 1,834 grams
Dimensions 19.00 x 26.10 x 5.60 cms
Product Classification: Precision instruments manufacture
Ksh 47,700.00
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Designed to provide beginners with an introduction to optical metrology without sacrificing rigor, this handbook discusses key principles and techniques before exploring practical applications. It explores everything from interferometry, holography, and Moiré metrology to diffraction, scattering, and polarization. This second edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.

Handbook of Optical Metrology: Principles and Applications

begins by discussing key principles and techniques before exploring practical applications of optical metrology. Designed to provide beginners with an introduction to optical metrology without sacrificing academic rigor, this comprehensive text:

  • Covers fundamentals of light sources, lenses, prisms, and mirrors, as well as optoelectronic sensors, optical devices, and optomechanical elements
  • Addresses interferometry, holography, and speckle methods and applications
  • Explains Moiré metrology and the optical heterodyne measurement method
  • Delves into the specifics of diffraction, scattering, polarization, and near-field optics
  • Considers applications for measuring length and size, displacement, straightness and parallelism, flatness, and three-dimensional shapes

This new Second Edition is fully revised to reflect the latest developments. It also includes four new chapters—nearly 100 pages—on optical coherence tomography for industrial applications, interference microscopy for surface structure analysis, noncontact dimensional and profile metrology by video measurement, and optical metrology in manufacturing technology.


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