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Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis

By: Patrick Echlin (Author)

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Ksh 23,750.00

Format: Hardback or Cased Book

ISBN-13: 9780387857305

Publisher: Springer-Verlag New York Inc.

Publication Date: Mar 19th, 2009

Weight: 872 grams

Dimension: 18.60 x 26.80 x 2.30 cms

Category: Microscopy

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The analytical system depends on collecting the x-ray photons that are generated within the sample as a consequence of interaction with the same high energy beam of primary electrons used to produce images.

Get Handbook of Sample Preparation for Scanning Electron Microscopy and X-Ray Microanalysis by Patrick Echlin at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Springer-Verlag New York Inc. and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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