High k Gate Dielectrics
Book Details
Format
Hardback or Cased Book
ISBN-10
0750309067
ISBN-13
9780750309066
Publisher
Taylor & Francis Ltd
Imprint
Institute of Physics Publishing
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Dec 1st, 2003
Print length
614 Pages
Weight
1,167 grams
Product Classification:
Electricity, electromagnetism & magnetismElectronic devices & materials
Ksh 47,700.00
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The drive toward smaller and smaller electronic componentry of microelectronics is demanding new materials with higher electrical permittivity. An impressive collection of methods with in-depth coverage, High k Gate Dielectrics reviews the state-of-the-art in high permittivity gate dielectric research. Leading researchers from Europe and the USA de
The drive toward smaller and smaller electronic componentry has huge implications for the materials currently being used. As quantum mechanical effects begin to dominate, conventional materials will be unable to function at scales much smaller than those in current use. For this reason, new materials with higher electrical permittivity will be required, making this is a subject of intensive research activity within the microelectronics community.
High k Gate Dielectrics reviews the state-of-the-art in high permittivity gate dielectric research. Consisting of contributions from leading researchers from Europe and the USA, the book first describes the various deposition techniques used for construction of layers at these dimensions. It then considers characterization techniques of the physical, chemical, structural, and electronic properties of these materials. The book also reviews the theoretical work done in the field and concludes with technological applications.
High k Gate Dielectrics reviews the state-of-the-art in high permittivity gate dielectric research. Consisting of contributions from leading researchers from Europe and the USA, the book first describes the various deposition techniques used for construction of layers at these dimensions. It then considers characterization techniques of the physical, chemical, structural, and electronic properties of these materials. The book also reviews the theoretical work done in the field and concludes with technological applications.
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