High Resolution X-Ray Diffractometry And Topography
Book Details
Format
Hardback or Cased Book
ISBN-10
0850667585
ISBN-13
9780850667585
Publisher
Taylor & Francis Ltd
Imprint
Taylor & Francis Ltd
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Feb 5th, 1998
Print length
262 Pages
Weight
656 grams
Dimensions
26.30 x 17.80 x 2.00 cms
Product Classification:
Maths for scientistsMaths for engineers
Ksh 36,000.00
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The application of electronic materials has created a demand for reliable techniques for examining these materials. This book looks at the area of x-ray diffraction and the modern techniques available for deployment in research. It provides the background for applying these techniques.
The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
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