Hot Carrier Degradation in Semiconductor Devices
Softcover reprint of the original 1st ed. 2015
Book Details
Format
Paperback / Softback
ISBN-10
3319359126
ISBN-13
9783319359120
Edition
Softcover reprint of the original 1st ed. 2015
Publisher
Springer International Publishing AG
Imprint
Springer International Publishing AG
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Sep 24th, 2016
Print length
517 Pages
Weight
864 grams
Dimensions
23.60 x 15.60 x 2.80 cms
Product Classification:
Electronic devices and materialsSemi-conductors & super-conductors
Ksh 12,600.00
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This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of today’s most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (“become hot”), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.
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