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Influence of Temperature on Microelectronics and System Reliability

By: USA) Lall Alabama Pradeep (Auburn University (Author) , Michael G. Pecht (Author) , Edward B. Hakim (Author)

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Ksh 40,800.00

Format: Hardback or Cased Book

ISBN-13: 9780849394508

Publisher: Taylor & Francis Inc

Publication Date: Apr 24th, 1997

Weight: 794 grams

Dimension: 26.40 x 18.40 x 2.30 cms

Category: Engineering thermodynamics

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This book provides a sound scientific basis for achieving system operation without reliability penalties at realistic steady state temperatures. guidelines for thermal derating of microelectronic devices.

Get Influence of Temperature on Microelectronics and System Reliability by Pradeep (Auburn University, Alabama, USA) Lall at the best price and quality guranteed only at Werezi Africa largest book ecommerce store. The book was published by Taylor & Francis Inc and it has pages. Enjoy Shopping Best Offers & Deals on books Online from Werezi - Receive at your doorstep - Fast Delivery - Secure mode of Payment

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