Introduction to Quantum Metrology : Quantum Standards and Instrumentation
Softcover reprint of the original 1st ed. 2015
Book Details
Format
Paperback / Softback
ISBN-10
3319384791
ISBN-13
9783319384795
Edition
Softcover reprint of the original 1st ed. 2015
Publisher
Springer International Publishing AG
Imprint
Springer International Publishing AG
Country of Manufacture
CH
Country of Publication
GB
Publication Date
Oct 9th, 2016
Print length
279 Pages
Weight
458 grams
Dimensions
15.60 x 23.40 x 2.00 cms
Product Classification:
Science: general issuesScientific standardsScientific standards, measurement etcMensuration & systems of measurementCondensed matter physics (liquid state & solid state physics)Condensed matter physics (liquid state and solid state physics)NanotechnologyElectronics engineering
Ksh 18,000.00
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This book presents the theory of quantum effects used in metrology and results of the author’s own research in the field of quantum electronics.
Theoretical Background of Quantum Metrology.- Measures, Standards and Systems of Units.- Quantum Voltage Standards.- SQUID Detectors of Magnetic Flux.- Quantum Hall Effect.- Quantization of Electrical Conductance and Thermal Conductance in Nanostructures.- Single Electron Tunneling and Possible Current Standard.- Atomic Clocks and Time Scales.- Interferometers and Measurements of Length.- Scanning Probe Microscopes.- Other Quantum Detectors.- Standards of the Kilogram Based on Fundamental Physical Constants.
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