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Ionizing Radiation Effects In Mos Oxides

By: Usa) Oldham Timothy R (Us Army Research Lab (Author)

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Ksh 14,650.00

Format: Hardback or Cased Book

ISBN-13: 9789810233266

Publisher: World Scientific Publishing Co Pte Ltd

Publication Date: Jan 26th, 2000

Weight: 396 grams

Dimension: 22.90 x 15.40 x 1.80 cms

Category: Condensed matter physics

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As a result of work on the nature of the electrically active defects in MOS oxides which are generated by exposure to ionizing radiation, the understanding of the basic physical mechanisms has evolved. This text summarizes the new work and integrates it with older work to form a unified picture.

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