Local Electrode Atom Probe Tomography : A User's Guide
2013 ed.
Book Details
Format
Hardback
ISBN-10
146148720X
ISBN-13
9781461487203
Edition
2013 ed.
Publisher
Springer-Verlag New York Inc.
Imprint
Springer-Verlag New York Inc.
Country of Manufacture
US
Country of Publication
GB
Publication Date
Dec 7th, 2013
Print length
318 Pages
Weight
606 grams
Dimensions
24.10 x 16.30 x 1.80 cms
Product Classification:
Spectrum analysis, spectrochemistry, mass spectrometryNanotechnologyTesting of materials
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Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis.
This book is the first, single-source guide to successful experiments using the local electrode atom probe (LEAP®) microscope. Coverage is both comprehensive and user friendly, including the fundamentals of preparing specimens for the microscope from a variety of materials, the details of the instrumentation used in data collection, the parameters under which optimal data are collected, the current methods of data reconstruction, and selected methods of data analysis. Tricks of the trade are described that are often learned only through trial and error, allowing users to succeed much more quickly in the challenging areas of specimen preparation and data collection. A closing chapter on applications presents selected, state-of-the-art results using the LEAP microscope.
Get Local Electrode Atom Probe Tomography by Brian P. Geiser, David J. Larson at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Springer-Verlag New York Inc. and it has 318 pages.
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