Skip to main content
Cart 0
Lock-in Thermography
Click to zoom

Share this book

Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials

Third Edition 2018

Book Details

Format Hardback
ISBN-10 3319998242
ISBN-13 9783319998244
Edition Third Edition 2018
Publisher Springer International Publishing AG
Imprint Springer International Publishing AG
Country of Manufacture CH
Country of Publication GB
Publication Date Jan 22nd, 2019
Print length 321 Pages
KSh 25,200.00
Currently unavailable 0 in stock

Delivery Location

Delivery fee: Select location

Secure
Quality
Fast
Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.

Get Lock-in Thermography by Martin C. Schubert, Otwin Breitenstein at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Springer International Publishing AG and it has 321 pages.

Shopping Cart

Africa largest book store

Sub Total: