Lock-in Thermography : Basics and Use for Evaluating Electronic Devices and Materials
Third Edition 2018
Book Details
Format
Hardback or Cased Book
Book Series
Springer Series in Advanced Microelectronics
ISBN-10
3319998242
ISBN-13
9783319998244
Edition
Third Edition 2018
Publisher
Springer International Publishing AG
Imprint
Springer International Publishing AG
Country of Manufacture
CH
Country of Publication
GB
Publication Date
Jan 22nd, 2019
Print length
321 Pages
Product Classification:
Testing of materialsElectronics engineering
Ksh 25,200.00
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Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems.
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included.
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