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Materials Characterization Techniques
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Materials Characterization Techniques

Book Details

Format Hardback or Cased Book
ISBN-10 1420042947
ISBN-13 9781420042948
Publisher Taylor & Francis Inc
Imprint CRC Press Inc
Country of Manufacture GB
Country of Publication GB
Publication Date Dec 22nd, 2008
Print length 342 Pages
Weight 634 grams
Dimensions 24.60 x 16.20 x 4.60 cms
Ksh 23,400.00
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Presents the principles of surface and structural characterization techniques for quality assurance, contamination control, and process improvement. This book reviews popular and powerful analysis and quality control tools, explaining the appropriate uses and related technical requirements.

Experts must be able to analyze and distinguish all materials, or combinations of materials, in use today—whether they be metals, ceramics, polymers, semiconductors, or composites. To understand a material’s structure, how that structure determines its properties, and how that material will subsequently work in technological applications, researchers apply basic principles of chemistry, physics, and biology to address its scientific fundamentals, as well as how it is processed and engineered for use.

Emphasizing practical applications and real-world case studies, Materials Characterization Techniques presents the principles of widely used, advanced surface and structural characterization techniques for quality assurance, contamination control, and process improvement.

This useful volume:

  • Explores scientific processes to characterize materials using modern technologies
  • Provides analysis of materials’ performance under specific use conditions
  • Focuses on the interrelationships and interdependence between processing, structure, properties, and performance
  • Details the sophisticated instruments involved in an interdisciplinary approach to understanding the wide range of mutually interacting processes, mechanisms, and materials
  • Covers electron, X-ray-photoelectron, and UV spectroscopy; scanning-electron, atomic-force, transmission-electron, and laser-confocal-scanning-florescent microscopy, and gel electrophoresis chromatography
  • Presents the fundamentals of vacuum, as well as X-ray diffraction principles

Explaining appropriate uses and related technical requirements for characterization techniques, the authors omit lengthy and often intimidating derivations and formulations. Instead, they emphasize useful basic principles and applications of modern technologies used to characterize engineering materials, helping readers grasp micro- and nanoscale properties. This text will serve as a valuable guide for scientists and engineers involved in characterization and also as a powerful introduction to the field for advanced undergraduate and graduate students.


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