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Measurement Techniques for Radio Frequency Nanoelectronics

By: T. Mitch Wallis (Author) , Pavel Kabos (Author)

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Ksh 26,900.00

Format: Hardback or Cased Book

ISBN-13: 9781107120686

Publisher: Cambridge University Press

Publication Date: Sep 14th, 2017

Weight: 790 grams

Dimension: 25.30 x 17.80 x 1.80 cms

Category: Microwave technology

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Understand the fundamentals of radio frequency measurement of nanoscale devices with this practical, cross-disciplinary guide. Featuring numerous examples linking theoretical concepts with real-world applications, it is the ideal resource for researchers in both academia and industry new to the field of radio frequency nanoelectronics.

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