Microelectronics Failure Analysis Desk Reference
Seventh Edition
Book Details
Format
Hardback or Cased Book
ISBN-10
162708245X
ISBN-13
9781627082457
Edition
Seventh Edition
Publisher
A S M International
Imprint
A S M International
Country of Manufacture
US
Country of Publication
GB
Publication Date
Dec 30th, 2019
Print length
705 Pages
Weight
1,810 grams
Dimensions
53.30 x 28.80 x 3.00 cms
Product Classification:
Electronics engineering
Ksh 36,000.00
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Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples. This new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures.
The Electronic Device Failure Analysis Society proudly announces the Seventh Edition of the Microelectronics Failure Analysis Desk Reference, published by ASM International. The new edition will help engineers improve their ability to verify, isolate, uncover, and identify the root cause of failures. Prepared by a team of experts, this updated reference offers the latest information on advanced failure analysis tools and techniques, illustrated with numerous real-life examples.
Topics include:
Topics include:
- Failure Analysis Process and Management—wafer, package, and board level failure analysis flow.
- Incoming Inspection Tools—optical, x-ray, and scanning acoustic microscopy.
- Fault Isolation—front and backside sample preparation, CAD navigation, laser-assisted device alteration (LADA), soft defect location (SDL), lock-in thermography, laser voltage probing (LVP), photon emission, EOTPR/TDR/TDT, and current imaging.
- Device and Circuit Characterization—scanning electron microscopy (SEM)-based and atomic force microscopy (AFM)-based nanoprobing.
- FIB Technique and Circuit Edit— FIB overview and advanced circuit edit for first silicon debug.
- Physical Analysis—deprocessing, cross section analysis, scanning electron microscopy, material analysis techniques, transmission electron microscopy (TEM), and scanning probe microscopy.
- Memory FA—DRAM, semiconductor memory failure signature analysis.
- Special Applications—automotive FA, 2.5 and 3D packaging failure analysis, microelectromechanical systems (MEMS), optoelectronics, solar, and counterfeit electronics.
- Fundamental Topics—integrated circuit testing, analog design, reliability, quality, and training.
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