Microprobe Characterization of Optoelectronic Materials
by
Juan Jimenez
Book Details
Format
Hardback or Cased Book
ISBN-10
1560329416
ISBN-13
9781560329411
Publisher
Taylor & Francis Inc
Imprint
CRC Press Inc
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Nov 15th, 2002
Print length
730 Pages
Weight
1,111 grams
Ksh 94,500.00
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0 in stock
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Discusses microprobe technique and its usefulness as diagnostic technique for device degradation. This book considers various types of probes (electrons, photons and tips) and different microscopes (optical, electron microscopy and tunneling). It is suitable for researchers, crystal growers and optoelectronic device makers.
Each chapter in this book is written by a group of leading experts in one particular type of microprobe technique. They emphasize the ability of that technique to provide information about small structures (i.e. quantum dots, quantum lines), microscopic defects, strain, layer composition, and its usefulness as diagnostic technique for device degradation. Different types of probes are considered (electrons, photons and tips) and different microscopies (optical, electron microscopy and tunneling). It is an ideal reference for post-graduate and experienced researchers, as well as for crystal growers and optoelectronic device makers.
Get Microprobe Characterization of Optoelectronic Materials by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Taylor & Francis Inc and it has pages.
