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Microscopy of Semiconducting Materials

By: UK) Cullis A.G (University of Sheffield (Author) , UK) Beanland Towcester R (GEC-Marconi (Author)

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Ksh 114,000.00

Format: Hardback or Cased Book

ISBN-13: 9780750306508

Publisher: Taylor & Francis Ltd

Publication Date: Jan 1st, 2000

Dimension: 23.40 x 15.60 x 142.80 cms

Category: Microscopy

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Presents an overview of advances in semiconductor studies using microscopy. This book explores the use of transmission and scanning electron microscopy, ultra fine electron probes, and EELS to investigate semi conducting structures. It is suitable for academics and researchers in materials science, and electrical and electronic engineering.

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