MOS Interface Physics, Process and Characterization
Book Details
Format
Hardback or Cased Book
ISBN-10
1032106271
ISBN-13
9781032106274
Publisher
Taylor & Francis Ltd
Imprint
CRC Press
Country of Manufacture
US
Country of Publication
GB
Publication Date
Oct 12th, 2021
Print length
162 Pages
Weight
390 grams
Dimensions
15.70 x 23.50 x 1.70 cms
Ksh 18,700.00
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The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
The electronic device based on Metal Oxide Semiconductor (MOS) structure is the most important component of a large-scale integrated circuit and the key to achieving high performance devices. This book contains experimental examples focusing on MOS and will be a reference for academics and postgraduates in the field of microelectronics.
Get MOS Interface Physics, Process and Characterization by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Taylor & Francis Ltd and it has pages.
