Nanometer–scale Defect Detection Using Polarized Light
Book Details
Format
Hardback or Cased Book
ISBN-10
1848219369
ISBN-13
9781848219366
Publisher
ISTE Ltd and John Wiley & Sons Inc
Imprint
ISTE Ltd and John Wiley & Sons Inc
Country of Manufacture
US
Country of Publication
GB
Publication Date
Aug 12th, 2016
Print length
320 Pages
Weight
612 grams
Dimensions
24.10 x 16.50 x 2.30 cms
Product Classification:
NanotechnologyTesting of materialsApplied optics
Ksh 25,000.00
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This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
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