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Particle and Particle Systems Characterization
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Particle and Particle Systems Characterization : Small-Angle Scattering (SAS) Applications

Book Details

Format Hardback or Cased Book
ISBN-10 1466581778
ISBN-13 9781466581777
Publisher Taylor & Francis Inc
Imprint CRC Press Inc
Country of Manufacture GB
Country of Publication GB
Publication Date Nov 22nd, 2013
Print length 336 Pages
Weight 646 grams
Dimensions 24.00 x 15.40 x 2.30 cms
Ksh 34,200.00
Werezi Extended Catalogue 0 in stock

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Small-angle scattering (SAS) is a powerful technique for investigating the whole set of geometric parameters describing (micro)particles embedded in a material. Particularly, disordered particle assembles can be explored via SAS. This book explains several models and approaches of SAS for the study of densely packed systems. Written by one of the leaders in the field, it is essential reading for material scientists, physicists, and crystallographers using SAS to explore, understand, and tailor properties of materials and their structure.

Small-angle scattering (SAS) is the premier technique for the characterization of disordered nanoscale particle ensembles. SAS is produced by the particle as a whole and does not depend in any way on the internal crystal structure of the particle. Since the first applications of X-ray scattering in the 1930s, SAS has developed into a standard method in the field of materials science. SAS is a non-destructive method and can be directly applied for solid and liquid samples.

Particle and Particle Systems Characterization: Small-Angle Scattering (SAS) Applications is geared to any scientist who might want to apply SAS to study tightly packed particle ensembles using elements of stochastic geometry. After completing the book, the reader should be able to demonstrate detailed knowledge of the application of SAS for the characterization of physical and chemical materials.


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