Particles on Surfaces : Detection: Adhesion, and Removal
Book Details
Format
Hardback or Cased Book
ISBN-10
0824795350
ISBN-13
9780824795351
Publisher
Taylor & Francis Inc
Imprint
CRC Press Inc
Country of Manufacture
US
Country of Publication
GB
Publication Date
Dec 16th, 1994
Print length
438 Pages
Weight
816 grams
Product Classification:
Surface chemistry & adsorption Plastics & polymers technology
Ksh 39,600.00
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Includes the proceedings of the Fourth Symposium on Particles on Surfaces. This title includes papers that cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; and, particle contamination in microelectronics, on spacecraft, and on optical surfaces.
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
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