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Photo-induced Defects in Semiconductors

By: California) Redfield David (Stanford University (Author) , California) Bube Richard H. (Stanford University (Author)

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Ksh 11,300.00

Format: Paperback or Softback

ISBN-13: 9780521024457

Publisher: Cambridge University Press

Publication Date: Mar 9th, 2006

Weight: 350 grams

Dimension: 22.90 x 15.20 x 1.40 cms

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This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. These metastable defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices.

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