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Photo-induced Defects in Semiconductors

By: California) Redfield David (Stanford University (Author) , California) Bube Richard H. (Stanford University (Author)

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Ksh 17,750.00

Format: Hardback or Cased Book

ISBN-13: 9780521461962

Publisher: Cambridge University Press

Publication Date: Jan 26th, 1996

Weight: 494 grams

Dimension: 23.70 x 15.90 x 2.20 cms

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This is the first book to give a complete overview of the properties of deep-level, localized defects in semiconductors. These metastable defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices.

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