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Physical Principles of Electron Microscopy
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Physical Principles of Electron Microscopy : An Introduction to TEM, SEM, and AEM

Softcover reprint of the original 2nd ed. 2016

Book Details

Format Paperback / Softback
ISBN-10 3319819860
ISBN-13 9783319819860
Edition Softcover reprint of the original 2nd ed. 2016
Publisher Springer International Publishing AG
Imprint Springer International Publishing AG
Country of Manufacture GB
Country of Publication GB
Publication Date May 30th, 2018
Print length 196 Pages
Weight 334 grams
Dimensions 15.60 x 23.40 x 1.60 cms
Ksh 9,900.00
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Scanning and stationary-beam electron microscopes are indispensable tools for both research and routine evaluation in materials science, the semiconductor industry, nanotechnology and the biological, forensic, and medical sciences. This book introduces current theory and practice of electron microscopy, primarily for undergraduates who need to understand how the principles of physics apply in an area of technology that has contributed greatly to our understanding of life processes and "inner space." Physical Principles of Electron Microscopy will appeal to technologists who use electron microscopes and to graduate students, university teachers and researchers who need a concise reference on the basic principles of microscopy.


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