Plasma Etching Processes for CMOS Devices Realization
Book Details
Format
Hardback or Cased Book
ISBN-10
1785480960
ISBN-13
9781785480966
Publisher
ISTE Press Ltd - Elsevier Inc
Imprint
ISTE Press Ltd - Elsevier Inc
Country of Manufacture
NL
Country of Publication
GB
Publication Date
Jan 18th, 2017
Print length
136 Pages
Weight
372 grams
Dimensions
16.00 x 23.70 x 1.50 cms
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Plasma etching has long enabled the perpetuation of Moore's Law. Today, etch compensation helps to create devices that are smaller than 20 nm. But, with the constant downscaling in device dimensions and the emergence of complex 3D structures (like FinFet, Nanowire and stacked nanowire at longer term) and sub 20 nm devices, plasma etching requirements have become more and more stringent.Now more than ever, plasma etch technology is used to push the limits of semiconductor device fabrication into the nanoelectronics age. This will require improvement in plasma technology (plasma sources, chamber design, etc.), new chemistries (etch gases, flows, interactions with substrates, etc.) as well as a compatibility with new patterning techniques such as multiple patterning, EUV lithography, Direct Self Assembly, ebeam lithography or nanoimprint lithography.This book presents these etch challenges and associated solutions encountered throughout the years for transistor realization.
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