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Positron Annihilation in Semiconductors
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Positron Annihilation in Semiconductors : Defect Studies

Softcover reprint of hardcover 1st ed. 1999

Book Details

Format Paperback / Softback
ISBN-10 3642084036
ISBN-13 9783642084034
Edition Softcover reprint of hardcover 1st ed. 1999
Publisher Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Country of Manufacture DE
Country of Publication GB
Publication Date Dec 1st, 2010
Print length 383 Pages
Weight 626 grams
Dimensions 15.60 x 23.20 x 4.70 cms
Ksh 32,400.00
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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods.

This comprehensive book reports on recent investigations of lattice imperfections in semiconductors by means of positron annihilation. It reviews positron techniques, and describes the application of these techniques to various kinds of defects, such as vacancies, impurity vacancy complexes and dislocations.


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