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Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

By: (Edited by) Daniel M Fleetwood , (Edited by) Ronald D Schrimpf

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Ksh 24,100.00

Format: Hardback or Cased Book

ISBN-10: 9812389407

ISBN-13: 9789812389404

Series: Selected Topics in Electronics and Systems

Publisher: World Scientific Publishing Co Pte Ltd

Imprint: World Scientific Publishing Co Pte Ltd

Country of Manufacture: GB

Country of Publication: GB

Publication Date: Aug 3rd, 2004

Print length: 348 Pages

Product Classification: Circuits & components

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This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

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