Reliability And Radiation Effects In Compound Semiconductors
Book Details
Format
Hardback or Cased Book
ISBN-10
981427710X
ISBN-13
9789814277105
Publisher
World Scientific Publishing Co Pte Ltd
Imprint
World Scientific Publishing Co Pte Ltd
Country of Manufacture
SG
Country of Publication
GB
Publication Date
Apr 28th, 2010
Print length
376 Pages
Weight
664 grams
Dimensions
23.50 x 16.20 x 2.60 cms
Product Classification:
Semi-conductors & super-conductors
Ksh 21,600.00
Werezi Extended Catalogue
Delivery in 28 days
Delivery Location
Delivery fee: Select location
Delivery in 28 days
Secure
Quality
Fast
Discusses reliability and radiation effects in compound semiconductors. This book features reliability mechanisms present in compound semiconductors that have produced a great deal of confusion.
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.
Get Reliability And Radiation Effects In Compound Semiconductors by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by World Scientific Publishing Co Pte Ltd and it has pages.
