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Reliability And Radiation Effects In Compound Semiconductors

By: (Author) Allan H Johnston

Extended Catalogue

Ksh 21,600.00

Format: Hardback or Cased Book

ISBN-10: 981427710X

ISBN-13: 9789814277105

Publisher: World Scientific Publishing Co Pte Ltd

Imprint: World Scientific Publishing Co Pte Ltd

Country of Manufacture: SG

Country of Publication: GB

Publication Date: Apr 28th, 2010

Print length: 376 Pages

Weight: 664 grams

Dimensions (height x width x thickness): 23.50 x 16.20 x 2.60 cms

Product Classification: Semi-conductors & super-conductors

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Discusses reliability and radiation effects in compound semiconductors. This book features reliability mechanisms present in compound semiconductors that have produced a great deal of confusion.
This book focuses on reliability and radiation effects in compound semiconductors, which have evolved rapidly during the last 15 years. It starts with first principles, and shows how advances in device design and manufacturing have suppressed many of the older reliability mechanisms.It is the first book that comprehensively covers reliability and radiation effects in optoelectronic as well as microelectronic devices. It contrasts reliability mechanisms of compound semiconductors with those of silicon-based devices, and shows that the reliability of many compound semiconductors has improved to the level where they can be used for ten years or more with low failure rates.

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