Reliability Wearout Mechanisms in Advanced CMOS Technologies
Book Details
Format
Hardback or Cased Book
Book Series
IEEE Press Series on Microelectronic Systems
ISBN-10
0471731722
ISBN-13
9780471731726
Publisher
John Wiley & Sons Inc
Imprint
Wiley-IEEE Press
Country of Manufacture
US
Country of Publication
GB
Publication Date
Sep 4th, 2009
Print length
640 Pages
Weight
993 grams
Dimensions
24.30 x 16.40 x 3.40 cms
Product Classification:
Circuits & componentsComputer science
Ksh 29,500.00
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This invaluable resource tells the complete story of failure mechanisms from basic concepts to the tools necessary to conduct reliability tests and analyze the results. Both a text and a reference work for this important area of semiconductor technology, it assumes no reliability education or experience.
Get Reliability Wearout Mechanisms in Advanced CMOS Technologies by at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by John Wiley & Sons Inc and it has pages.
