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Research on the Radiation Effects and Compact Model of SiGe HBT
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Research on the Radiation Effects and Compact Model of SiGe HBT

Softcover reprint of the original 1st ed. 2018

Book Details

Format Paperback / Softback
Book Series Springer Theses
ISBN-10 9811351813
ISBN-13 9789811351815
Edition Softcover reprint of the original 1st ed. 2018
Publisher Springer Verlag, Singapore
Imprint Springer Verlag, Singapore
Country of Manufacture GB
Country of Publication GB
Publication Date Jan 4th, 2019
Print length 168 Pages
Ksh 16,200.00
Werezi Extended Catalogue 0 in stock

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This book primarily focuses on the radiation effects and compact model of silicon-germanium (SiGe) heterojunction bipolar transistors (HBTs).

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