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Scanning Electron Microscopy and X-ray Microanalysis
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Scanning Electron Microscopy and X-ray Microanalysis : Third Edition

Third Edition 2003

Book Details

Format Hardback
ISBN-10 0306472929
ISBN-13 9780306472923
Edition Third Edition 2003
Publisher Springer Science+Business Media
Imprint Kluwer Academic/Plenum Publishers
Country of Manufacture US
Country of Publication GB
Publication Date Jan 31st, 2003
Print length 689 Pages
Weight 1,684 grams
Dimensions 25.50 x 17.80 x 3.80 cms
Product Classification: MicroscopyMaterials science
KSh 18,000.00
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In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers.

This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. The authors emphasize the practical aspects of the techniques described. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis. Separate chapters cover SEM sample preparation methods for hard materials, polymers, and biological specimens. In addition techniques for the elimination of charging in non-conducting specimens are detailed.


Get Scanning Electron Microscopy and X-ray Microanalysis by Charles E. Lyman, Dale E. Newbury at the best price and quality guaranteed only at Werezi Africa's largest book ecommerce store. The book was published by Springer Science+Business Media and it has 689 pages.

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