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Scanning Electron Microscopy and X-Ray Microanalysis

By: Joseph Goldstein (Author) , Dale E. Newbury (Author) , David C. Joy (Author)

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Ksh 19,450.00

Format: Hardback or Cased Book

ISBN-13: 9780306472923

Publisher: Springer Science+Business Media

Publication Date: Apr 30th, 2007

Weight: 1684 grams

Dimension: 25.50 x 17.80 x 3.80 cms

Category: Microscopy

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This text provides students as well as practitioners with a comprehensive introduction to the field of scanning electron microscopy (SEM) and X-ray microanalysis. Topics discussed include user-controlled functions of scanning electron microscopes and x-ray spectrometers and the use of x-rays for qualitative and quantitative analysis.

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