Scanning Force Microscopy : With Applications to Electric, Magnetic and Atomic Forces
Revised
by
Dror Sarid
Book Details
Format
Hardback or Cased Book
Book Series
Oxford Series in Optical and Imaging Sciences
ISBN-10
019509204X
ISBN-13
9780195092042
Edition
Revised
Publisher
Oxford University Press Inc
Imprint
Oxford University Press Inc
Country of Manufacture
GB
Country of Publication
GB
Publication Date
Oct 20th, 1994
Print length
288 Pages
Weight
679 grams
Dimensions
24.10 x 16.20 x 2.30 cms
Product Classification:
MicroscopyApplied physics
Ksh 31,900.00
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This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation and applications are discussed.
This technology has proved indispensable as a characterization tool with applications in surface physics, chemistry, materials science, bio-science, and data storage media. It has also shown great potential in areas such as the semiconductor and optical quality control industries. This revised edition updates the earlier such survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in SFM and a thoroughly revised bibliography. Academic and industrial researchers using SFM or wishing to know more about its potential, will find this book an excellent introduction to this rapidly developing field.
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